HVPE法制备AlN单晶薄膜
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Preparation of AlN Single Crystal Film by Hydride Vapor Phase Epitaxy(HVPE)
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    摘要:

    采用氢化物气相外延(HVPE)在6HSiC衬底上生长AlN单晶薄膜。利用热力学理论计算源区Al-N-H体系中的物质平衡,表明源区温度为800~900 K时,HCl与AlCl3气体分压为1∶3,主要产物是对石英管腐蚀较低的AlCl3。控制源区温度800~900 K,生长区温度1 373 K,HCl流量25 cm3/min,分析NH3和HCl流量比(R)对薄膜形貌及结晶度的影响。R=0.5时,获得表面平整光滑且厚度为7 μm的AlN单晶。

    Abstract:

    AlN single crystal film was grown on 6HSiC substrate by hydride vapor phase epitaxy (HVPE). The thermodynamic theory was used to calculate the mass balance in the source region of AlNH system. It is indicated that when the source temperature is set to 800~900 K, the partial pressure ratio of HCl and AlCl3 will be 1∶3, and the main reactant will be AlCl3 which owns lower corrosion to quartz tube. The experimental effect of flow ratio of NH3 to HCl(R) on the morphology and crystallinity of AlN films was analyzed with the source temperature of 800~900 K, growth area temperature of 1 373 K, and HCl flow of 25 cm3/min. AlN single crystal with smooth surface and thickness of 7 μm is obtained under the R ratio of 0.5.

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李毓轩,秦知福. HVPE法制备AlN单晶薄膜[J].压电与声光,2016,38(3):409-412. LI Yuxuan, QIN Zhifu. Preparation of AlN Single Crystal Film by Hydride Vapor Phase Epitaxy(HVPE)[J]. PIEZOELECTRICS AND ACOUSTOOPTICS

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  • 在线发布日期: 2016-05-31
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